Call for Papers

All submissions will be handled electronically. Submission instructions will be posted on the conference website in due course. All reviewing will be carried out double-blind by the Program Committee. In submitting a manuscript to YC-ICT, authors acknowledge that no paper substantially similar in content has been or will be submitted to another conference or workshop during the YC-ICT review period (July 16, 2009 – Aug 10, 2009). Papers accepted by the conference will be published by IEEE and are expected to be indexed by the engineering index (EI).

Topics of interest include all aspects of Information, Computing and Telecommunications, including, but are not limited to the following areas:

Signal/Image/Language/Speech Processing
Computer Vision/Graphics/Multimedia
Artificial Intelligence/Machine Learning/Data Mining
Distributed and Parallel Computing
Database Technology
Embedded Programming
Information Security
Software Engineering
Simulation and Modeling
Pattern Recognition
Topological Design and Network Configuration
Performance Evaluation of Telecommunication Systems
Telecommunication Standards
Designing and Modeling of High Availability Networks
Optical Communications
Wireless Communications
Wired and Wireless Networks
Sensor Networks
Traffic Control
Network Security
Advance Computer Architectures and Systems
Application Specific Architectures and Systems
Parallel Processor Architectures and Systems
Wearable Computing and Applications
Embedded Architectures
Distributed and Pervasive Systems
Human-Machine Interface
Computer Security
Software Specifications, Architecture, Design, Analysis and Testing
Software Security, Safety and Reliability
Operating Systems and Programming Environments
Distributed System Software and Middleware
Mobile and Embedded System Software
Management of Streaming Data, Metadata and XML

Important Date

Full paper (camera-ready) submission deadline: July 18, 2009
Notification of acceptance: August 15, 2009
Registration deadline for authors: August 30, 2009
Conference: Sept. 20-21, 2009